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晶向对InGaP/GaAs HBT性能的影响
引用本文:石瑞英,刘训春,孙海峰,袁志鹏.晶向对InGaP/GaAs HBT性能的影响[J].半导体学报,2004,25(4):446-449.
作者姓名:石瑞英  刘训春  孙海峰  袁志鹏
作者单位:[1]四川大学物理系,成都610064 [2]中国科学院微电子中心,北京100029
基金项目:国家重点基础研究发展计划(973计划)
摘    要:在对In Ga P/ Ga As HBT特性的研究中发现,发射极长边与主对准边垂直(0 1 1 ]方向)和平行(0 1 1 ]方向)放置时,其直流电流增益和截止频率是不同的.0 1 1 ]方向的直流电流增益远远大于0 1 1 ]方向,而它的截止频率则略小于0 1 1 ]方向.文献中认为电流增益的不同是压电效应产生的,但这种观点并不能很好地解释截止频率的晶向依赖性.文中用压电效应和两个互相垂直方向上发射区侧向腐蚀形状的不同很好地解释了所有实验结果

关 键 词:InGaP/GaAsHBT晶向效应    直流电流增益    截止频率    压电效应    侧向腐蚀
文章编号:0253-4177(2004)04-0446-04
修稿时间:2003年3月21日

Orientation Effects on InGaP/GaAs HBT
Shi Ruiying ,Liu Xunchun ,Sun Haifeng and Yuan Zhipeng.Orientation Effects on InGaP/GaAs HBT[J].Chinese Journal of Semiconductors,2004,25(4):446-449.
Authors:Shi Ruiying    Liu Xunchun  Sun Haifeng and Yuan Zhipeng
Affiliation:Shi Ruiying 1,2,Liu Xunchun 2,Sun Haifeng 2 and Yuan Zhipeng 2
Abstract:Orientation effect on self-aligned InGaP/GaAs HBT is described.The DC current gain of the transistor with the emitter long edge parallel to orientation is greater than that of parallel to .But it shows slightly better RF performance for orientation with .f. t 69GHz compared to .f. t of 62GHz for the orientation.In previous paper,the DC current gain difference of between the two orientation transistors is attributed to the piezoelectric effect,but the difference of .f. t is not explained.It is proposed that the dependence of the characteristics is attributed to both piezoelectric effect and the difference between etched pattern in different directions.
Keywords:InGaP/GaAs HBT orientation effect  DC current gain  piezoelectric effect  cut-off frequency  etched pattern
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