| 热电薄膜平面内热电性能测量技术 |
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| 引用本文： | 穆武第,程海峰,唐耿平. 热电薄膜平面内热电性能测量技术[J]. 电子测量技术, 2009, 32(7): 62-65 |
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| 作者姓名： | 穆武第 程海峰 唐耿平 |
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| 作者单位： | 国防科技大学新型陶瓷纤维及其复合材料国防科技重点实验室,长沙,410073 |
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| 摘 要： | 介绍了一种测量热电薄膜平面内Seebeck系数和电导率一体化的测量装置。本装置可用于测量室温到300℃温度范围内薄膜材料平面内Seebeck系数和电导率，测量过程简单，测量成本低，且不会对薄膜造成损伤。实验证明，在薄膜两端沉积一层导电性好的铜膜后，该测量装置完全可以忽略接触电阻的影响，使得测量稳定性好，精度高，可满足纳米薄膜热电材料的Seebeck系数和电导率的一体化测量的要求。
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| 关 键 词： | 热电薄膜 Seebeck系数 电导率 |
Measuring technology for in-plane thermoelectric properties of thermoelectric films |
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| Mu Wudi,Cheng Haifeng,Tang Gengping. Measuring technology for in-plane thermoelectric properties of thermoelectric films[J]. Electronic Measurement Technology, 2009, 32(7): 62-65 |
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| Authors: | Mu Wudi Cheng Haifeng Tang Gengping |
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| Affiliation: | Key Lab of CFC;National University of Defense Technology;Changsha 410073 |
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| Abstract: | A measuring technology for in-plane Seebeck coefficient and conductivity of thermoelectric films altogether was introduced. The instrument can measure the thermoelectric performance at the range of temperature from room temperature to 300℃. The operation is simple and the films are undamaged after testing. And the cost of testing is cheapness. The experimental results show that the measuring system, which has stable performance and high precision, is qualified to measure the Seebeck coefficient and conductivity of thermoelectric films. |
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| Keywords: | thermoelectric films Seebeck coefficient conductivity |
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