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Mass loss rate in collodion is greatly reduced at liquid helium temperature |
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| Authors: | M K Lamvik D A Kopf S D Davilla |
| Abstract: | The mass thickness of collodion films has been monitored at several temperatures, under conditions typical of electron microscopy, through the use of an electron energy loss spectrometer. Compared to room temperature, only a five-fold reduction in the rate of mass loss was observed through the use of a commercial liquid nitrogen cooled stage; in contrast, the rate of mass loss was reduced more than one hundred fold when these films were held at liquid helium temperature. |
| Keywords: | Collodion mass loss radiation damage superconducting lens electron energy loss spectrometer inelastic electron scattering low temperature electron microscopy analytical electron microscopy |