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Studies of supported metal catalysts using high resolution secondary electron imaging in a STEM
Authors:D. Imeson
Abstract:An additional technique for use in the characterization of catalysts by electron microscopy is presented. High resolution secondary electron images obtained in a VG HB501 scanning transmission electron microscope have been used to study the surface topography of catalysts consisting of small metal particles on high surface area carbon supports. Surface features down to nanometre dimensions can be seen, allowing the examination of micropores in the support as well as larger pore structures. The results are compared with pore size distributions determined by gas adsorption methods, and are shown to yield valuable additional information. In addition, the method in principle allows examination of the locations of small metal catalyst particles on the support.
Keywords:Catalysts  secondary electron imaging  catalyst characterization  pore size determination  surface topography  STEM  high resolution imaging  SEM
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