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低漏电流、抑制NBTI效应的多米诺电路
引用本文:梁华国,徐辉,黄正峰,易茂祥. 低漏电流、抑制NBTI效应的多米诺电路[J]. 半导体学报, 2014, 35(1): 015009-6
作者姓名:梁华国  徐辉  黄正峰  易茂祥
作者单位:合肥工业大学,合肥工业大学计算机科学与信息学院,合肥工业大学电子科学与应用物理学院,合肥工业大学电子科学与应用物理学院
基金项目:国家自然科学基金项目(61274036,61106038),教育部博士点基金项目(20110111120012)
摘    要:NBTI导致的晶体管老化成为影响电路稳定性的主导因素,同时,降低电路的泄漏功耗是电路设计的目标之一。多米诺电路广泛应用在高性能集成电路中。本文提出了一种多米诺电路用来抑制NBTI引起的多米诺电路衰退并同时降低待机模式下的泄漏电流。在待机模式下,利用2个晶体管将标准多米诺电路的动态节点和输出节点同时上拉为电源电平,从而将保持器和输出反相器中的pMOS晶体管同时置为NBTI的恢复模式。使用全0输入向量和其中增加的一个晶体管的堆栈效应降低待机模式下多米诺电路的泄漏电流。实验表明针对NBTI效应,该方法降低了最多33%的性能衰退,并同时减少了最多79%的泄漏电流。

关 键 词:多米诺电路;负偏置温度不稳定性;漏电流;待机模式

Low-Leakage and NBTI-Mitigated N-Type Domino Logic
Liang Huaguo,Xu Hui,Huang Zhengfeng and Yi Maoxiang. Low-Leakage and NBTI-Mitigated N-Type Domino Logic[J]. Chinese Journal of Semiconductors, 2014, 35(1): 015009-6
Authors:Liang Huaguo  Xu Hui  Huang Zhengfeng  Yi Maoxiang
Affiliation:Heifei University of Technology,School of Computer and Information, Heifei University of Technology,School of Electronic Science and Applied Physics,Heifei University of Technology,School of Electronic Science and Applied Physics,Heifei University of Technology
Abstract:NBTI-induced transistor aging has become a prominent factor affecting the reliability of circuits. Reducing leakage consumption is one of the major design goals. Domino logic circuits are extensively applied in high-performance integrated circuits. A circuit technique to mitigate NBTI-induced degradation and reduce standby leakage current is presented in this paper. Two transistors are added to standard domino circuit to pull both dynamic node and output up to VDD, which put both keeper and inverter pMOS transistor into recovery mode in standby mode. Due to stack effect, leakage current is reduced by all-0 input vector and the added transistor. Experimental results reveal up to 33% NBTI-induced degradation reduction and up to 79% leakage current reduction.
Keywords:Domino logic circuit   negative bias temperature instability   leakage current   standby mode
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