Electrical tree initiation mechanism of artificial defects filled XLPE |
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| Affiliation: | 1. Department of Chemical Engineering, University of Seoul, 90 Jeonnong-Dong, Dongdaemun-Gu, Seoul 130-743, South Korea;2. Department of Life Science, University of Seoul, 90 Jeonnong-Dong, Dongdaemun-Gu, Seoul 130-743, South Korea;1. Institute of Chemistry, University of São Paulo, Butantã 748, 26077 São Paulo, Brasil;2. Institute of Low Temperature and Structure Research, University of Wrocław, Okólna 2, 50-422 Wroclaw, Poland;1. College of Polymer Science and Engineering, State Key Laboratory of Polymer Materials Engineering, Sichuan University, Chengdu, 610065, China;2. College of Chemical Engineering, Sichuan University, Chengdu, 610065, China;3. Corbion Purac China, Unit 08-09, 30F, #6088 Humin Road, Minhang District, Shanghai 201199, China;1. Humboldt-Universität zu Berlin, Institute of Physics, Newtonstr. 15, 12489 Berlin, Germany;2. Johannes Kepler University Linz, Institute of Polymeric Materials and Testing, Altenberger Straße 69, 4040 Linz, Austria;3. Johannes Kepler University Linz, Institute for Analytical Chemistry, Altenberger Straße 69, 4040 Linz, Austria |
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| Abstract: | The electrical tree initiation and propagation mechanism in XLPE (cross-linked polyethylene) with artificial voids filled with N2 gas, O2 gas or moisture was investigated. Treeing phenomena (pits, filamentary channel, voids, bridge, etc.) were observed and dielectric deterioration and breakdown mechanism were discussed. Oxidized region and rough electrode surface acted as the stress concentration point and from which electrical treeing deterioration processes were initiated after a tree inception time and started to propagate three-dimensionally toward the plane electrode. The width of the broken tree channel was 117 μm and the thickness of the tree was 1 to 30 μm. The dielectric breakdown occurred when a tree channel bridged the two electrodes. |
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