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Fabrication of extremely thermal-stable GaN template on Mo substrate using double bonding and step annealing process
Authors:Wang Qing  Liu Yang  Sun Yongjian  Tong Yuzhen  Zhang Guoyi
Affiliation:1. School of Electronics and Information Technology, Sun Yat-Sen University, Guangzhou 510275, China;2. College of Engineering, Peking University, Beijing 100871, China;3. Sino Nitride Semiconductor Ltd., Dongguan 523500, China
Abstract:A new layer transfer technique which comprised double bonding and a step annealing process was utilized to transfer the GaN epilayer from a sapphire substrate to a Mo substrate. Combined with the application of the thermal-stable bonding medium, the resulting two-inch-diameter GaN template showed extremely good stability under high temperature and low stress state. Moreover, no cracks and winkles were observed. The transferred GaN template was suitable for homogeneous epitaxial, thus could be used for the direct fabrication of vertical LED chips as well as power electron devices. It has been confirmed that the double bonding and step annealing technique together with the thermal-stable bonding layer could significantly improve the bonding strength and stress relief, finally enhancing the thermal stability of the transferred GaN template.
Keywords:gallium nitride  Mo substrate  medium bonding  laser lift off  thermal stability  homogeneous epitaxial
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