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Carbon nanotubes as tips for atomic force microscopy
Authors:GUO Li-qiu
Affiliation:Precision Engineering Research Institute, Harbin Institute of Technology, Harbin 150001 China;School of Mechanical Engineering, Tsinghua University, Beijing 100084, China;Precision Engineering Research Institute, Harbin Institute of Technology, Harbin 150001 China
Abstract:Ordinary AFM probes'characters prevent the AFM' s application in various scopes. Carbon nanotubes represent ideal AFM probe materials for their higher aspect ratio, larger Young's modulus, unique chemical structure, and well-defined electronic property. Carbon nanotube AFM probes are obtained by using a new method of attaching carbon nanotubes to the end of ordinary AFM probes, and are then used for doing AFM experiments. These experiments indicated that carbon nanotube probes have higher elastic deformation, higher resolution and higher durability. And it was also found that carbon nanotube probes ean accurately reflect the morphology of deep narrow gaps, while ordinary probes can not reflect.
Keywords:carbon nanotube  atomic force microscope (AFM)  probe
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