摘 要: | Y99-61677-54 0008263JEDEC 123准则的高频限制=High frequency limita-tions of the JEDEC 123 guideline会,英]/Williams,D.F.//Characterization of flip-chip CMOS ASIC simultane-ous switching noise on multilayer organic and ceramicBGA/CGA packages.—54~57(EG)本文对 JEDEC 123准则所描述的工序中固有的系统高频误差进行了评价。此准则适合于电子封装电感和电容模型参数的测量。参6
|