| 单片机控制的频率特性测试仪 |
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| 引用本文： | 徐仁贵,管运生,王普. 单片机控制的频率特性测试仪[J]. 仪表技术与传感器, 2001, 0(3): 16-17 |
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| 作者姓名： | 徐仁贵 管运生 王普 |
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| 作者单位： | 山东建筑工程学院济南市 250013 |
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| 摘 要： | 文中介绍了一种由单片机控制的频率特性测试仪，能方便地测试一个系统的幅频特性和相频特性。文中说明了该仪器的结构、工作原理和性能要点。
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| 关 键 词： | 频率特性 测试仪 单片机 自动控制 |
| 修稿时间： | 2000-11-10 |
The Frequency Characteristic Testing Meter Based on Single Chip Microcomputer |
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| Xu Rengui,Guan Yunsbeng,Wang Pu. The Frequency Characteristic Testing Meter Based on Single Chip Microcomputer[J]. Instrument Technique and Sensor, 2001, 0(3): 16-17 |
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| Authors: | Xu Rengui Guan Yunsbeng Wang Pu |
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| Abstract: | This paper presents a type of frequency characteristic testing meter which is based on single chip microcomputer.It can measure the magnitude characteristic and phase charactertic of a system,especially be suited for experiment teaching.In this paper,its structure,operation principle and performance have been illustrated. |
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| Keywords: | Frequency Characteristic Testing Meter Single Chip Microcomputer |
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