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Depth profiling of CdS homojunction using AES analysis |
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| Authors: | K P Varkey K P Vijayakumar Jun Imai Toshihjro Yoshida Yasube Kashiwaba |
| Affiliation: | (1) Department of Physics, Cochin University of Science and Technology, 682 022 Cochin, India;(2) Department of Applied Chemistry and Molecular Science, Faculty of Engineering, Iwate University, Ueda 4-3-0, 020 Morioka, Japan;(3) Chemical Division, Iwate Industrial Research Institute, Tioka-Shinden, 020 Morioka, Japan;(4) Department of Electrical and Electronic Engineering, Faculty of Engineering, Iwate University, 020 Morioka, Japan |
| Abstract: | Top layer of spray pyrolyzedn-type CdS has been converted intop-type by diffusion of copper which resulted in the formation of homojunction. This is achieved by annealing CdS/Cu bilayer film. The nature of diffusion of copper atoms into CdS has been studied using auger electron spectroscopy (AES). |
| Keywords: | Cadmium sulphide spray pyrolysis AES |
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