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A method to correct coordinate distortion in EBSD maps
Affiliation:1. Univ Lyon, INSA Lyon, UCBL, CNRS, MATEIS, UMR5510, 69621 Villeurbanne, France;2. Laboratoire de Synthèse & Fonctionnalisation des Céramiques, UMR3080 CNRS-Saint-Gobain CREE, Saint-Gobain Research Provence, Cavaillon 84306, France;3. Univ Lyon, Université Claude Bernard Lyon 1, CNRS, Institut Lumière Matière, 69622 Villeurbanne, France;1. Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China;2. National Engineering Research Center for Equipment and Technology of Cold Strip Rolling, College of Mechanical Engineering, Yanshan University, Qinhuangdao 066004, China;1. Department of Materials Science and Engineering, Norwegian University of Science and Technology, 7491 Trondheim, Norway;2. Department of Physics, Norwegian University of Science and Technology, 7491 Trondheim, Norway
Abstract:Drift during electron backscatter diffraction mapping leads to coordinate distortions in resulting orientation maps, which affects, in some cases significantly, the accuracy of analysis. A method, thin plate spline, is introduced and tested to correct such coordinate distortions in the maps after the electron backscatter diffraction measurements. The accuracy of the correction as well as theoretical and practical aspects of using the thin plate spline method is discussed in detail. By comparing with other correction methods, it is shown that the thin plate spline method is most efficient to correct different local distortions in the electron backscatter diffraction maps.
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