HgCdTe体晶的组份均匀性分析

利用ＳＰＲＩＴＥ探测器的截止波长研究了布里奇曼、Ｔｅ溶剂和固态再结晶３种方法制备的ＨｇＣｄＴｅ体晶组份的均匀性。实验结果表明：３种方法生长的ＨｇＣｄＴｅ晶片的组份均匀性大致相当。用任意一种材料研制的一个８条ＳＰＲＩＴＥ探测器，其任意２条的截止波长差不大于０．８μｍ的概率大于９８％。

Comparison of Compositional Uniformity of HgCdTe Bulk Crystals Prepared by Three Techniques

The compositional uniformity of HgCdTe bulk crystals prepared by Bridgman,Te solutionand solid state recrystallization three techniques is studied and compared by measuring the cutoffwavelength of SPRITE detectors. And the compositional uniformity of HgCdTe bulk crystals prepared by three techniques are approximately equal. If an eightstripe SPRITE array is fabricatedwith any one of the three HgCdTe bulk Crystals, the probability that the variable of cutoff wavelength of arbitray two stripe elements is less and equal 0.8 micrometer will be large than 98 percent.