| 基于平均功率谱的高精度A/D转换器动态参数测试 |
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| 引用本文： | 俞宙,杨晗,崔庆林,蒋和全.基于平均功率谱的高精度A/D转换器动态参数测试[J].微电子学,2007,37(3):341-344,348. |
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| 作者姓名： | 俞宙 杨晗 崔庆林 蒋和全 |
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| 作者单位： | 1. 中国电子科技集团公司,第二十四研究所
2. 中国电子科技集团公司,第二十四研究所;模拟集成电路国家重点实验室,重庆,400060 |
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| 摘 要： | 讨论了窗函数处理在基于FFT变换的高精度A/D转换器动态参数测试中的不足,提出了基于平均功率谱的高精度A/D转换器动态参数测试方法,并从理论上证明了该方法可以有效降低FFT变换测试方法中由于采用窗函数处理引入的噪声误差。最后,以ADI公司的16位A/D转换器AD9260为例,对其信噪比和总谐波失真等动态参数进行了测试实验验证。
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| 关 键 词： | 高精度A/D转换器 动态参数测试 平均功率谱 信噪比 总谐波失真 |
| 文章编号： | 1004-3365（2007）03-0341-04 |
| 修稿时间： | 2006-12-112007-02-09 |
Measurement of Dynamic Parameters of High-Resolution A/D Converters Based on Power-Spectral Averaging |
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| YU Zhou,YANG Han,CUI Qing-lin,JIANG He-quan.Measurement of Dynamic Parameters of High-Resolution A/D Converters Based on Power-Spectral Averaging[J].Microelectronics,2007,37(3):341-344,348. |
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| Authors: | YU Zhou YANG Han CUI Qing-lin JIANG He-quan |
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| Affiliation: | 1. Sichuan Institute of Solid State Circuits, CETC; 2. National Laboratory of Analog Integrated Circuits, Chongqfng 400060, P. R. China |
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| Abstract: | Measurement 05 dynamic parameters 05 the high-resolution A/D converter is studied using power-spectral averaging technique. It is theoretically demonstrated that the noise 51oor introduced 5rom the window 5unction processing in FFT computation could be greatly reduced by using this technique. Test perSorrned on a 16-bit A/D converter shows that experimental results are in good agreement with theoretical computation. |
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| Keywords: | High-resolution A/D converter Power-spectral averaging SNR THD |
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