| 基于March X算法的SRAM BIST的设计 |
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| 引用本文： | 冯国臣,沈绪榜,刘春燕. 基于March X算法的SRAM BIST的设计[J]. 微电子学与计算机, 2005, 22(12): 44-47 |
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| 作者姓名： | 冯国臣 沈绪榜 刘春燕 |
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| 作者单位： | 西安微电子技术研究所,陕西,西安,710054 |
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| 摘 要： | 针对LS-DSP中嵌入的128kb SRAM模块,讨论了基于March X算法的BIST电路的设计.根据SRAM的故障模型和测试算法的故障覆盖率,讨论了测试算法的选择、数据背景的产生:完成了基于March X算法的BIST电路的设计.128kb SRAM BIST电路的规模约为2000门,仅占存储器面积的1.2%,故障覆盖率高于80%.
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| 关 键 词： | 测试 March算法 |
| 文章编号： | 1000-7180(2005)12-044-04 |
| 修稿时间： | 2005-06-22 |
SRAM BIST Design Based on March X Algorithm |
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| FENG Guo-chen,SHEN Xu-bang,LIU Chun-yan. SRAM BIST Design Based on March X Algorithm[J]. Microelectronics & Computer, 2005, 22(12): 44-47 |
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| Authors: | FENG Guo-chen SHEN Xu-bang LIU Chun-yan |
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| Abstract: | To 128kb SRAM embedded in LS-DSP, the BIST circuits based on March X algorithm are discussed. The selection of test algorithm and the generation of the data background are discussed at first, based on the fault model and the fault rate of the algorithm. Based on March X algorithm, the BIST circuits are finished. And its scale is about 2000 gates. The area is only about 1.2% of the SRAM, while the fault coverage is higher than 80%. |
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| Keywords: | SRAM BIST |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
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