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利用FPGA实现红外焦平面器件的非均匀性校正
引用本文:陈宝国,郑志伟,黄士科,沈振康.利用FPGA实现红外焦平面器件的非均匀性校正[J].红外与激光工程,2000,29(4):55-57.
作者姓名:陈宝国  郑志伟  黄士科  沈振康
作者单位:1. 中国空空导弹研究院,洛阳,471009
2. 国防科技大学ATR实验室,长沙,410073
摘    要:与红外单元器件系统相比,焦平面面阵测器的一个最大的缺点是其固有的非均匀性,尽管现在面阵探测器的非均匀性有了很大改进,但是非均匀性仍然限制凝视红色系统的探测性能。实用化、、实时的非均匀性校正是红外焦平面器件应用的一个关键技术,尽管现在已经有很多种基于场景的非均匀性校正方法,但是两点校正算法仍然是基础的校正方法,有不可替代的价值。两点校正算法的流程简单固定,非常适合用FPGA实现。文章介绍了利用FPG

关 键 词:红外焦平面探测器  非均匀性校正  FPGA
修稿时间:1999-12-30

IRFPA nonuniformity correction using the FPGA technology
Chen Baoguo,Zheng Zhiwei,Huang Shike,Shen Zhenkang.IRFPA nonuniformity correction using the FPGA technology[J].Infrared and Laser Engineering,2000,29(4):55-57.
Authors:Chen Baoguo  Zheng Zhiwei  Huang Shike  Shen Zhenkang
Abstract:Compared to one element detector infrared system, the most difficult problem associated with the IR focal plane array is spatial photoresponse nonuniformity. Although the detector's performances, including uniformity, have been improved greatly, the staring IR system performance is crucial limited by the nonuniformity. Applicable and real time nonuniformity correction is a key technology in the application of IRFPA. There are many scene\|based nonuniformity correction methods, in which the two\|points correction method as a basic method is used widely. The two\|points correction algorithmic flow is simple and fixed, and suitable to be implemented by FPGA. In this paper, the two\|points method of nonuniformity correction using the FPGA technology is presented. The experiment results are given.
Keywords:IRFPA  Nonuniformity correction  FPGA  
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