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A novel region-based active contour model via local patch similarity measure for image segmentation
Authors:Yu  Haiping  He  Fazhi  Pan  Yiteng
Affiliation:1.School of Computer Science, Wuhan University, Wuhan, China
;2.State Key Lab of Software Engineering, School of Computer Science, Wuhan University, Wuhan, China
;
Abstract:Multimedia Tools and Applications - It is always difficult to accurately segment images with intensity inhomogeneity because most of the representative local-based models only take into account...
Keywords:
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