一种用于模拟电路测试与修调的方法 |
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引用本文: | 刘宁,;徐东明,;赵新毅.一种用于模拟电路测试与修调的方法[J].中国集成电路,2014(5):69-72. |
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作者姓名: | 刘宁 ;徐东明 ;赵新毅 |
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作者单位: | [1]西安邮电大学通信与信息工程学院,陕西西安710061; [2]西安深亚电子有限公司,陕西西安710061 |
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摘 要: | 针对模拟电路中一些基准量的测试与修调,本文提出了一种通过管脚复用技术和单多晶的EEPROM相结合的方法对模拟电路中的基准电压进行了测试与修调,然后通过仿真验证了该方法实现的电路功能。
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关 键 词: | 管脚复用 测试 修调 单层多晶EEPROM |
A test and modulation method used in analog circuit |
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Affiliation: | LIU Ning , XU Dong-ming , ZHAO Xin-yi (1. Xi 'an University of posts and Telecommunications Xi 'an 710061, China; 2. Xi'an Supermicro Electronics Co.,LTD, Xian 710060, China) |
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Abstract: | Aiming at testing and trimming of reference circuit of analog device, this paper presents a method by combining the pin multiplexing and a single poly EEPROM to test and trim the reference voltage of the analog circuits, and then verifies the functionality of the implementation based on the proposed method with simulation results. |
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Keywords: | pin multiplexing testing trimming single-poly EEPROM |
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