| X-射线荧光光谱法测定硅质耐火材料中二氧化硅的测量不确定度评定 |
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| 引用本文： | 郭腾飞,王本辉.X-射线荧光光谱法测定硅质耐火材料中二氧化硅的测量不确定度评定[J].分析仪器,2011(6):48-51. |
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| 作者姓名： | 郭腾飞 王本辉 |
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| 作者单位： | 中钢集团洛阳耐火材料研究院有限公司,河南省特种耐火材料重点实验室,洛阳,471039 |
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| 摘 要： | 介绍了X射线荧光光谱熔融法检测硅质耐火材料中二氧化硅的方法，对X射线荧光光谱熔融法测定硅质耐火材料中二氧化硅的结果产生不确定度的原因进行了分析，根据CSM010100108—2006X-射线荧光光谱法测量结果不确定度评定规范，对其进行了评定，建立了相关数学模型，为其他元素的测量不确定度评定提供了可借鉴的经验。
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| 关 键 词： | X射线荧光光谱法 不确定度评定 硅质耐火材料 二氧化硅 |
Evaluation of uncertainty in determination of silicon dioxide in silicon-refractory materials by X-ray fluorescence spectrometry |
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| Guo Tengfei,Wang Benhui.Evaluation of uncertainty in determination of silicon dioxide in silicon-refractory materials by X-ray fluorescence spectrometry[J].Analytical Instrumentation,2011(6):48-51. |
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| Authors: | Guo Tengfei Wang Benhui |
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| Affiliation: | Guo Tengfei,Wang Benhui(Henan Province Key Laboratory of Advanced Refractories,Sinosteel luoyang Institute of Refractories Research Institute Co.,Ltd.,Luoyang,471039) |
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| Abstract: | A method for determining SiO2 in silicon-refractory materials by X-ray fluorescence spectrometry combined with melting method is introduced.The causes of uncertainty originated in the determination are analyzed and the uncertainty of analytical results was evaluated according to CSM01010108-2006,X-ray fluorescence spectroscopy measurement uncertainty evaluation norms and the mathematical model for expressintg uncertainty was established. |
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