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X射线衍射仪样品测试架的改进
引用本文:刘秋朝,朱骏,陈小兵.X射线衍射仪样品测试架的改进[J].理化检验(物理分册),2004,40(11):583-584.
作者姓名:刘秋朝  朱骏  陈小兵
作者单位:扬州大学,物理科学与技术学院,扬州,225002
基金项目:国家自然科学基金资助课题(10274066)
摘    要:通过对X射线衍射仪样品架的改进,使尺寸过大或过小的样品的X射线衍射谱的测量更加方便与准确。对于小尺寸块状样品或薄膜样品,采用在样品背面加橡皮泥,用玻璃片压在铝制样品架上的方法固定;而通过裁剪铝制样品架,使大尺寸样品可方便地固定和测量。

关 键 词:X射线衍射仪  样品架  改选方法
文章编号:1001-4012(2004)11-0583-02

IMPROVEMENT OF THE SPECIMEN PLATE FOR X-RAY DIFFRACTION MEASUREMENT
LIU Qiu-chao,ZHU Jun,CHEN Xiao-bing.IMPROVEMENT OF THE SPECIMEN PLATE FOR X-RAY DIFFRACTION MEASUREMENT[J].Physical Testing and Chemical Analysis Part A:Physical Testing,2004,40(11):583-584.
Authors:LIU Qiu-chao  ZHU Jun  CHEN Xiao-bing
Abstract:The X-ray pattern measuring on the specimen with larger or smaller size become easy and exact after the improvement of the specimen plates. The block sample or thin film can be fixed in specimen Al- plate with any plasticene on the back of the sample or film. The sample with larger size can be easily fixed and measured with the aid of cutting the specimen Al- plate.
Keywords:X-ray diffraction instrument  Specimen plate  Improvement method
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