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分形多重相关方差X线颅颌影像边缘检测
引用本文:蒋爱平,王祁.分形多重相关方差X线颅颌影像边缘检测[J].哈尔滨工业大学学报,2006,38(6):902-905.
作者姓名:蒋爱平  王祁
作者单位:哈尔滨工业大学,电气工程与自动化学院,哈尔滨,150001;黑龙江大学,电子工程学院,哈尔滨,150080;哈尔滨工业大学,电气工程与自动化学院,哈尔滨,150001
基金项目:黑龙江省自然科学基金 , 黑龙江省教育厅科学技术研究项目 , 黑龙江大学校科研和教改项目
摘    要:针对X线颅颌影像片边缘检测十分困难的问题,提出一种基于多重相关方差的计算多重分形谱的算法.构建一个X线图像的五邻域多重相关空间,定义图像的多重分形谱的概率测度,对数字X线头影侧位片进行多重分形性质的分析.通过图像的多重分形谱与权重因子相关性的分析,进一步判定线形区间及适当的权重因子,得到X线头影片图像的多重分形的线性区间,验证X线头影片图像的多重分形的几何性质,实现对X线头影侧位片的整体轮廓的边缘提取.该算法具有保持和加强图像的局部特性,突出图像的细微处的特点,克服了多重分形谱对噪声敏感的缺点,能有效抑制图像中的噪声.

关 键 词:分形  多重分形  边缘检测  标志点  头影测量
文章编号:0367-6234(2006)06-0902-04
收稿时间:2005-09-05
修稿时间:2005年9月5日

Image edge detection of cephalogram based on multifractal multi-correlation variance
JIANG Ai-ping,WANG Qi.Image edge detection of cephalogram based on multifractal multi-correlation variance[J].Journal of Harbin Institute of Technology,2006,38(6):902-905.
Authors:JIANG Ai-ping  WANG Qi
Affiliation:1. School of Electrical Engineering and Automatics, Harbin Institute of Technology, Harbin 150001, China 2. School of Electronic Engineering, Heilongjiang University, Harbin 150080, China
Abstract:Multi-correlation variance approach based on multifractal used to estimate the multifractal spectrum is introduced.The probability based on X-ray image multi-correlation space is defined that can be used to estimate the multifractal spectrum.The multifractal spectrum property of cephalogram is analyzed and the relationship between the multifractal spectrum and its weight is discussed,so the multifractal linear region of cephalogram is determined.The geometrical properties of its multifractal are verified.The result of the edge detection of cephalogram used the above approach shows that the noise can be repressed effectively,the local property of an image can be remained as much as possible and the fine property can be stressed.
Keywords:fractal  multifractal  edge detection  landmark  cephalometric
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