The study of antireflecting dielectric film material on mercury cadmium telluride detector surface

The performance of Mercury Cadmium Telluride (MCT) infrared detector is not only determined by electrical parameters of material, but also by the surface state of sensitive element. This paper shows that by coating the surface of 8–12u MCT detector with an antireflecting dielectric material, reflection on the surface of sensitive element is decreased and quantum efficiency is increased therefore detectivity and responsivity are increased, usually by 15–30%.