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Microstructural index to quantify thermal spray deposit microstructures using image analysis |
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| Authors: | G. Montavon C. Coddet C. C. Berndt S. H. Leigh |
| Affiliation: | (1) Laboratoire d’études et de Recherches sur les Matériaux et les Propriétés de Surface, Institut Polytechnique de Sévenans, BP 449, 90 010 Belfort Cedex, France;(2) Center for Thermal Spray Research, State University of New York at Stony Brook, 11755-2275 Stony Brook, NY, USA;(3) Research Institute of Industrial Science and Technology (RIST), Materials Research Division, #32 Hyoja-Dong, Nam-ku, 790-600 Pohang City, Kyungbuk, Korea |
| Abstract: | |
| Keywords: | Euclidean distance map fractal dimension image analysis metallographic index quantitative metallography stereology |
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