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Estimation of the complex refractive index of epoxy resin phantom using EDTRM
Authors:Jin Wang  Zhi-Chao Deng  Teng-Qian Sun  Wen-Yuan Zhou  Chun-Ping Zhang
Affiliation:The Key Laboratory of Weak-Light Nonlinear Photonics , Ministry of Education, School of Physics and TEDA Applied Physics School, Nankai University , Tianjin 300071 , China
Abstract:Epoxy resin is a commonly used material in the manufacture of tissue-equivalent phantoms. The complex refractive index (RI) of a series of epoxy resin phantoms with different scattering ability was measured using a recently developed extended derivative total reflection method (EDTRM). Al2O3 particles were added into the epoxy resin substrate as the scattering constituent. An increase of the real and imaginary part of the RI with the amount of Al2O3 particles was observed. The real part of the RI values reached an impressive precision of 0.002 using EDTRM, which provides a means for the improvement in accuracy for analysis related to RI values in phantom studies.
Keywords:tissue-equivalent phantom  complex refractive index  extended derivative total reflection method
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