Rigorous and approximate analysis of metallic gratings in soft X-ray and EUV regions

Abstract

In deep ultraviolet and soft X-ray regions the complex refractive indices of metals differ substantially from their values in the visible region of the spectrum. The implications of this fact are analysed for metallic gratings illuminated by electromagnetic fields with wavelengths ranging from soft X‐rays to near infrared, concentrating on short wavelengths. In particular, we study metal-stripe gratings (linear polarizers for visible light) by rigorous diffraction theory to determine the short-wavelength region in which a combination of the geometrical thin-element approximation and the theory of single-layer films can be applied. Then we study inductive grid filters for protection of X-ray detectors from infrared radiation in space applications.