Analysis of coherent symmetrical illumination for electronic speckle pattern shearing interferometry |
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| Authors: | Juan F. Román Vicente Moreno Jon N. Petzing John R. Tyrer |
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| Affiliation: | 1. Bayer Diagnostics , Sudbury, CO10 2XQ, Suffolk, UK;2. Faculty of Physics , University of Santiago de Compostela , 15782, Santiago de Compostela, Spain;3. Wolfson School of Mechanical and Manufacturing Engineering , Loughborough University , Loughborough, Leics, LE11 3TU, UK |
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| Abstract: | In an effort to find a non-contact technique capable of providing measurements of in-plane strain, a speckle shearing interferometer was designed using symmetrical coherent illumination. This paper presents an analysis of the sensitivity to displacement and strain of this interferometer, together with an analysis of the phase-stepping of the resultant fringe patterns. New notation is introduced alongside this analysis to define the interference components in speckle shearing interferometers using multiple illumination beams. Experimental results show fringe patterns and phase stepping in support of the theoretical analysis. |
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