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基于度量的嵌入式软件缺陷风险分析研究
引用本文:阮顺领,卢才武. 基于度量的嵌入式软件缺陷风险分析研究[J]. 计算机工程与应用, 2013, 49(3): 61-64,87
作者姓名:阮顺领  卢才武
作者单位:西安建筑科技大学管理学院,西安,710055
基金项目:陕西省重点学科建设专项资金资助项目,陕西省科技计划项目
摘    要:通过对COSMIC-FFP模型的扩展优化提出了嵌入式软件系统度量的方法,从而解决了COSMIC-FFP模型不支持对含有复杂数学算法的嵌入式实时系统度量的问题,基于软件规模度量提出了软件缺陷度量的方法。通过对软件规模的准确度量和对软件缺陷风险的分析,发现软件项目过程风险管理的不足,达到降低软件项目过程风险的目的。

关 键 词:软件度量  缺陷密度  风险分析

Defects risk analysis of embedded software based on measurement
RUAN Shunling , LU Caiwu.. Defects risk analysis of embedded software based on measurement[J]. Computer Engineering and Applications, 2013, 49(3): 61-64,87
Authors:RUAN Shunling    LU Caiwu.
Affiliation:School of Management, Xi’an University of Architecture & Technology, Xi’an 710055, China
Abstract:The method of embedded software system measurement is offered based on the COSMIC-FFP model optimization. Thereby solving the problem of COSMIC-FFP model does not support to measure embedded real-time system with complicated mathematical algorithm. And on this basis the software defects measurement method is put forward. Software project risk management deficiencies are discovered during the whole process of software development, and software project risks are reduced by use of the new method.
Keywords:software measurement   defect density   risk analysis
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