Measurement of on-chip waveforms and pulse propagation in digital GaAs integrated circuits by picosecond electro-optic sampling |
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Authors: | Zhang X.-C. Jain R.K. |
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Affiliation: | Amoco Corporation, Naperville, USA; |
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Abstract: | We demonstrate precise measurement of sub-100 ps rise time on-chip electrical waveforms and of pulse propagation in digital GaAs integrated circuits with the use of picosecond electro-optic sampling. These experiments yield the first non-invasive measurement of single-gate propagation delays via direct and precise observation of on-chip waveforms at the input and output of individual logic gates internal to an integrated circuit. |
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