Characterization of Low Drop-Out during ageing and design for yield |
| |
| Affiliation: | 1. STMicroelectronics, 850 rue Jean Monnet, 38926 Crolles, France;2. IMEP-LAHC–Univ. Grenoble Alpes. CNRS, F-38000 Grenoble, France;1. Fraunhofer Institut für Zuverlässigkeit und Mikrointergation, 13355 Berlin, Germany;2. Forschungsschwerpunkt Technologien der Mikroperipherik, Technische Universität Berlin, 13355 Berlin, Germany;1. STMicroelectronics, Technology and Design Platform, 38926 Crolles, France;2. EER, IM2NP-ISEN, UMR-CNRS, 7334 maison des technologies, 83000, France;1. Deggendorf Institute of Technology, Dieter-Görlitz-Platz 1, 94469 Deggendorf, Germany;2. Universitat Autònoma de Barcelona (UAB), 08193 Bellaterra, Barcelona, Spain;1. Engineering Product Development Pillar, Singapore University of Technology and Design, 487372, Singapore;2. State Key Laboratory of Modern Optical Instrumentation, College of Optical Science and Engineering, Zhejiang University, Hangzhou 310027, China |
| |
| Abstract: | Low Drop-Out (LDO) voltage regulators are extensively used to provide a stable power supply voltage independent of load impedance. LDO must be robust with regard to input voltage, temperature and local mismatch variations. Moreover, it must fulfill these specifications all along its lifetime. The influence of process variation on LDO performances has intensively been studied, but only few works are reported about ageing mechanisms. This paper presents an illustrative case study on the change of LDO performances due to wear-out mechanisms. The ageing effects are investigated on the static and dynamic performances parameters. After introducing LDO design content, a review of degraded performances (Output Voltage VOUT, Power Supply Rejection Ratio (PSRR), shutdown current…) is presented and compared to simulation. Then, statistical VOUT measurements are presented and compared with Monte Carlo simulations. Finally, sizing for yield methodology is introduced. The objective is to find optimal device size to guarantee a target of failure rate in fresh and aged conditions. |
| |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ |
|
