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Thermal state of electronic assemblies applied to smart building equipped with QFN64 device subjected to natural convection
Affiliation:1. University of Paris, LTIE-GTE EA 4415, 50, rue de Sèvres, F-92410 Ville d''Avray, France;2. Polytechnic Institute of Coimbra, ISEC, DEM, Rua Pedro Nunes, Quinta da Nora, 3030-199 Coimbra, Portugal;3. University of the Basque Country, ENEDI Research Group, Plaza Europa 1, E-20018 San Sebastián, Spain;4. University of Bath, Department of Architecture and Civil Engineering, Claverton Down, Bath BA2 7AY, UK;1. Department of Electrical Engineering, Motilal Nehru National Institute of Technology (MNNIT), Allahabad, India;2. Department of Electrical and Electronics Engineering, University of Johannesburg, Auckland Park, Johannesburg, South Africa;3. Center for Advanced Life Cycle Engineering (CALCE), University of Maryland, College Park, MD, USA;4. Technology Development Group, Power Grid Corporation of India Limited, Gurgaon, Haryana, India;1. Department of Aerospace and Mechanical Engineering, University of Arizona, Tucson, AZ 85721, USA;2. Department of Naval Architecture, Ocean and Marine Engineering, University of Strathclyde, Glasgow, UK;3. Samsung Electronics, Seoul, South Korea;1. M/A-COM Technology Solutions, Lowell, MA, USA;2. University of Parma, Parma, Italy;1. Center for Creation of Symbiosis Society with Risk, Yokohama National University, 79-5 Tokiwadai, Hodogaya-ku, Yokohama-shi, 240-8501, Kanagawa, Japan;2. Suzuki Motor Corporation, 300 Takatsukacho, Minami-ku, Hamamatsu-shi, 432-8611, Shizuoka, Japan;3. Institute of Advanced Sciences, Yokohama National University, 79-5, Tokiwadai, Hodogaya-ku, Yokohama-shi, 240-8501, Kanagawa, Japan
Abstract:The performance and reliability of electronic components and assemblies strongly depend on their thermal state. The knowledge of the temperature distribution throughout the assembly is therefore an essential element to ensure their correct operation. This is the main objective of this work that examines the case of a conventional assembly equipped with a quad flat non-lead QFN64 subjected to free convection. This active electronic package is welded on a PCB which may be inclined by an angle varying between 0° and 90° (horizontal and vertical positions respectively) and generates during its operation a high power ranging from 0.1 to 1 W. Thermoregulation of the assembly is ensured by natural convection, given its many well known advantages in this engineering field. Accurate relationships are proposed to determine the temperature on different areas of the device and the PCB. They are determined by means of a 3D numerical approach based on the finite volume method confirmed by measurements on an actual installation. These relationships allow reliability improvement of these electronic assemblies that are widely used in many engineering fields such as computing industry, mobile telephony, home automation, automotive, embarked electronics and the smart building applications considered in this work. The present survey complements a recent study which quantifies the natural convective heat transfer on the considered electronic assembly equipped with the QFN64 device, for the same power range and angle of inclination.
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