Quantitative evaluation of bending reliability for a flexible near-field communication tag |
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| Affiliation: | 1. Department of Mechanical System Engineering, Kumoh National Institute of Technology, 61 Daehak-ro, Gumi, Gyeongbuk 39177, Republic of Korea;2. Nano-Convergence Mechanical Systems Research Division, Korea Institute of Machinery & Materials, 156 Gajeongbuk-ro, Daejeon 34103, Republic of Korea;1. Institute of Rail Transit (IRT), Tongji University, Caoan 4800, Jiading, Shanghai 201804, China;2. Intel China Software Center (ICSC), Zixing Road 880, Zizhu Science Park, Shanghai 200240, China;1. School of Reliability and Systems Engineering, Beihang University, Beijing, China;2. Science and Technology on Reliability and Environmental Engineering Laboratory, Beihang University, Beijing, China;3. Data Center of China Life Insurance Company Ltd., Beijing, China;1. SEES, Depto. de Ingeniería Eléctrica, CINVESTAV-IPN, Av. IPN 2208, C.P. 07360 México City, Mexico.;2. Micro and Nanotechnology Research Centre, Universidad Veracruzana. Calzada Ruiz Cortines No. 455, Col. Costa Verde, C.P. 94294 Boca del Río, Veracruz, Mexico.;3. Materials Science and Engineering Department, University of Texas at Dallas, Richardson, TX 75080, United States |
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| Abstract: | Flexible electronic devices under repetitive use inevitably entail damage accumulation that can cause failures in the components and interconnects. The main aim of this study involves proposing test procedures and corresponding testers that can be used to systematically evaluate the bending reliability of flexible electronic devices. In contrast to conventional bending test techniques based on a collapsing radius method, in the present study, the flexible devices were wrapped onto a roller to ensure a constant strain. An example of a near-field communication tag for smart phones was examined to verify the proposed test methods and testers. The results indicated that the critical curvature for cyclic failure was significantly lower than the static critical curvature. Curvature-life diagrams as evaluated by the proposed test method revealed that bending radius and alignment methods significantly affected the reliability of the tags. Thus, the curvature-life diagrams can be used to design a roller radius based on a predefined product life. |
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