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Reliability problems in state-of-the-art GaAs devices and circuits |
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| Authors: | A. Christou |
| Abstract: | A review of the reliability status of GaAs discrete devices and integrated circuits is given. In the present survey of new devices and circuits it is shown that a significant number of reliability problems continue to persist. |
| Keywords: | Reliability Electromigration Microwaves Gallium arsenide Transistors |