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半导体表面晶体完整性的SEM电子通道花样研究
引用本文:邱素娟,林奇全.半导体表面晶体完整性的SEM电子通道花样研究[J].半导体学报,1991,12(1):23-27.
作者姓名:邱素娟  林奇全
作者单位:机电部第十三研究所 石家庄050051 (邱素娟),机电部第十三研究所 石家庄050051(林奇全)
摘    要:本文对各种GaAs晶体表面作了SEM电子通道技术测量,对测得的电子通道花样进行了结晶学注释,确定了评价晶体完整性的标准。可广泛用来检查和评估半导体表面的晶体完整性.

关 键 词:GaAs晶体  SEM  电子通道像

Study on Crystal Perfection of Semiconductor Surfaces by SEM Electron Path Patterns
Qiu Sujuan/The th Institute of Ministry of Mochinery & Electronics IndustriesLin Qiquan/The th Institute of Ministry of Mochinery & Electronics Industries.Study on Crystal Perfection of Semiconductor Surfaces by SEM Electron Path Patterns[J].Chinese Journal of Semiconductors,1991,12(1):23-27.
Authors:Qiu Sujuan/The th Institute of Ministry of Mochinery & Electronics IndustriesLin Qiquan/The th Institute of Ministry of Mochinery & Electronics Industries
Affiliation:Qiu Sujuan/The 13th Institute of Ministry of Mochinery & Electronics IndustriesLin Qiquan/The 13th Institute of Ministry of Mochinery & Electronics Industries
Abstract:Various GaAs crystal surfaces have been investigated with SEM electron passage patternmethod. Crystallography annotations have been made, and a standard to evaluate the crystalperfection has been defined. The method can be widely used for examining and appraisingthe crystal perfection of semiconductor surfaces.
Keywords:Electron passage photograph  Crystal-band  Crystal-surface  Crystal perfection  GaAs  
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