Effect of Interfacial Reactions on the Reliability of Lead-Free Assemblies after Board Level Drop Tests |
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| Authors: | Yanghua Xia Chuanyan Lu Xiaoming Xie |
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| Affiliation: | (1) State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050, P.R. China;(2) DaimlerChrysler SIM Technology Co., Ltd., Shanghai, 200050, P.R. China |
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| Abstract: | The reliability of lead-free electronic assemblies after board level drop tests was investigated. Thin small outline package (TSOP) components with 42 FeNi alloy leads were reflow soldered on FR4 printed circuit boards (PCBs) with Sn3.0Ag0.5Cu (wt%) solder. The effects of different PCB finishes [organic solderability preservative (OSP) and electroless nickel immersion gold (ENIG)], multiple reflow (once and three times), and isothermal aging (500 h at 125°C after one time reflow) were studied. The ENIG finish showed better performance than its OSP counterparts. With the OSP finish, solder joints reflowed three times showed obvious improvement compared to those of the sample reflowed once, while aging led to apparent degradation. The results showed that intermetallic compound (IMC) types, IMC microstructure and solder microstructure compete with each other, all playing very important roles in the solder joint lifetime. The results also showed that it is important to specify adequate conditions for a given reliability assessment program, to allow meaningful comparison between results of different investigators. |
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| Keywords: | Lead-free solder joint drop test reliability intermetallic compounds microstructure |
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