ATE系统中基于相关采样定理的ADC测试方法和波形重建

简要的阐述了基于ATE系统的SOC芯片的测试技术，然后重点介绍了SOC芯片中混合信号部分中ADC的测试方法。并对其中起着关键作用的相关采样定理给出了详细的阐述，提出了在实际测试中无法满足定理时的解决方法。通过一款实际的SOC芯片为例，最终给出了实际的测试数据。

Waveform reconstructing method and effect to ADC parameter testing based on coherent sampling in ATE system

Firstly, the paper brief exposed the testing technology of SOC chip based on the ATE system, and then focus on the testing method on the part of the Mix-Signal ADC in the SOC chip. It detailed introduce the coherent sampling theorem that played an important role in the ADC testing, and the solution will be given when the theorem can not be satisfy. At last, through an actual SOC chip, the test data will be given.