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弹簧扁钢内部缺陷的分层超声C扫描成像技术研究
引用本文:陈振华, 郭文光, 章庆, 李红卫, 卢超. 弹簧扁钢内部缺陷的分层超声C扫描成像技术研究[J]. 失效分析与预防, 2015, 10(6): 339-345. DOI: 10.3969/j.issn.1673-6214.2015.06.002
作者姓名:陈振华  郭文光  章庆  李红卫  卢超
作者单位:1.1. 无损检测技术教育部重点实验室(南昌航空大学), 南昌 330063
摘    要:对弹簧扁钢的全厚度范围进行C扫描成像检测时,需以一定间隔调整焦点位置以确保检测精度。本研究测量了聚焦声束焦柱高度并分析其对C扫描图像的影响,提出了应用于弹簧扁钢全厚度C扫描成像检测的焦距调整法则。此外,通过分析C扫描图像的特征区域确定缺陷边界,并通过金相试验对其进行了验证。研究结果显示:根据焦柱高度确定焦距调整间隔可在提高检测效率的同时保证较高的检测精度,所提出的缺陷图像特征边界可用于精确测量缺陷尺寸;水浸聚焦超声C扫描成像方法可用于评价弹簧扁钢内部缺陷的尺寸及其分布。

关 键 词:弹簧扁钢  C扫描成像  金相试验  缺陷
收稿时间:2015-09-16
修稿时间:2015-11-15

Layer Scanning Imagery Technology on Inner Defects of Spring Flat Steel
CHEN Zhen-hua, GUO Wen-guang, ZHANG Qing, LI Hong-wei, LU Chao. Layer Scanning Imagery Technology on Inner Defects of Spring Flat Steel[J]. Failure Analysis and Prevention, 2015, 10(6): 339-345. DOI: 10.3969/j.issn.1673-6214.2015.06.002
Authors:CHEN Zhen-hua  GUO Wen-guang  ZHANG Qing  LI Hong-wei  LU Chao
Affiliation:1.1. Key Laboratory of Nondestructive Testing of Ministry of Education, Nanchang Hangkong University, Nanchang 330063, China
Abstract:When the ultrasonic C-scan image is adopted for full thickness range testing of spring flat steel, focus position must be adjusted with regular interval to keep better testing accuracy. In the research, the height of focusing column is measured and its influences to the C scan imaging are analyzed. And then, the adjusting law of focusing position for C scan imaging is proposed. Besides, the characteristic area of scanning imagery is analysis to decide the defects boundary and which is verified by metallographic test. The results indicate both higher testing accuracy and testing efficiency can be obtained by setting a proper focusing interval according to the height of focusing column, and the boundary of defect imagery proposed in the paper can be used to measure the defect's dimension. Therefore, utrasonic water immersion focusing method can be used to evaluate the dimension and distribution of inner defects in spring flat steel.
Keywords:spring flat steel  ultrasonic C-scan  metallographic  defect
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