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宽带电路交换核心芯片的验证与测试
引用本文:刘钊远,李宥谋,蒋林,邓军勇.宽带电路交换核心芯片的验证与测试[J].光通信技术,2009,33(7).
作者姓名:刘钊远  李宥谋  蒋林  邓军勇
作者单位:西安邮电学院,专用集成电路设计中心,西安,710061
摘    要:介绍了一种宽带电路交换核心芯片的结构,针对设计的电路给出了验证模型,讨论了功能验证的内容和方法,重点讨论了流片完成后如何对芯样片进行全面测试.给出了测试系统的组成,并对测试的步骤、内容和方法进行了讨论,最后给出了测试结果及其分析.芯片现已投入实际应用.

关 键 词:仿真验证  系统测试  电路交换

The verification and test of the chip in broadband circuit-switch
LIU Zhao-yuan,LI You-mou,JIANG Lin,DENG Jun-yong.The verification and test of the chip in broadband circuit-switch[J].Optical Communication Technology,2009,33(7).
Authors:LIU Zhao-yuan  LI You-mou  JIANG Lin  DENG Jun-yong
Affiliation:LIU Zhao-yuan,LI You-mou,JIANG Lin,DENG Jun-yong (ASIC Design center,Xi'an Institute of Posts and Telecommunications,Xi'an 710061,China)
Abstract:A structure of the chip in broadband circuit-switch was introduced. The verification model for the designed circuit was presented. The content and methods of functional verification are discussed. Here the full-chip test of prototype chip was analyzed in details. The components of the test system were given, and the steps, contents and methods of test have been discussed. Finally the results and its analysis of test were presented. Now the chip has been industrialized.
Keywords:ASIC
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