(Fe,Ti) 16N2 films with high saturation magnetization prepared by facing target sputtering |
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Authors: | H.Y. Wang E.Y. Jiang C.D. Wang S.L. Ming |
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Affiliation: | Department of Applied Physics, Tianjin University, Tianjin 300072, People's Republic of China |
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Abstract: | (Fe,Ti)-N films with a Ti concentration of 10 at.% were prepared on Si(100) and NaCl substrates by facing targets sputtering. The effects of the nitrogen pressure (PN) and the substrate temperature (Ts) on the formation of various (Fe,Ti)-N phases and their microstructures were investigated in detail. X-ray diffractometer and transmission electron microscope provided complete identification of the phases present in the films and the characterization of their microstructures. Films deposited at a lower PN = 1 3 × 10−2 Pa or a lower Ts = RT consist of mainly -phase. Films deposited at a higher PN = 1.3 2 × 10−1 Pa or a higher Ts = 200 °C contain a great many γ' and Fe2N phases with a higher nitrogen content. When PN = 4 7 × 10−2 Pa and Ts = 100 150 °C, it is advantageous to the formation of ′' phase. These films exhibit a high saturation magnetization (Ms) up to the range of 2.3 2.5 T, which is larger than that of pure iron. |
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Keywords: | Magnetic properties and measurements Nitrides Sputtering Transmission electron microscopy (TEM) |
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