| 运算放大器的低频噪声测试方法 |
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| 引用本文： | 吴勇,庄奕琪. 运算放大器的低频噪声测试方法[J]. 电子科技, 2004, 0(6): 11-14 |
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| 作者姓名： | 吴勇 庄奕琪 |
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| 作者单位： | 西安电子科技大学微电子研究所,陕西,西安,710071;西安电子科技大学微电子研究所,陕西,西安,710071 |
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| 摘 要： | 运算放大器广泛应用于电路设计中,其可靠性指标直接影响电路系统的性能.运放器件的低频噪声特征同其性能及可靠性指标密切相关.本文中详细给出了运放器件低频噪声的测试方法并对测试过程中的若干关键问题进行了深入剖析.
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| 关 键 词： | 运算放大器 低频噪声测试 可靠性 |
| 修稿时间： | 2004-04-08 |
The Method for Measuring Low Frequency Noise in the Operational Amplifier |
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| Wu Yong,Zhuang Yiqi. The Method for Measuring Low Frequency Noise in the Operational Amplifier[J]. Electronic Science and Technology, 2004, 0(6): 11-14 |
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| Authors: | Wu Yong Zhuang Yiqi |
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| Abstract: | Operational amplifiers are widely used in circuit design Its reliability is of great importance to the performance of circuits. The low frequency noise characteristic of the operational amplifier is closely related to its performance and reliability indicator[2].This paper presents a detailed discussion of the method for measuring low frequency noise in operational amplifier devices as well as an analysis of some key problems in the measuring process. |
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| Keywords: | Operational amplifier low frequency noise measurement reliability of electronic devices |
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