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An optical device to measure in‐line residence time distribution curves during extrusion
Authors:Toms Jeferson A Mlo  Sebastio V Canevarolo
Affiliation:Tomás Jeferson A. Mélo,Sebastião V. Canevarolo
Abstract:This paper proposes a setup for in‐line measurement of residence time distribution (RTD) curves during extrusion. The detection system is composed of a slit die with transparent borosilicate glass windows fixed at the extruder exit, an optical arrangement with an incandescent light microbulb with fixed luminescence, and a Light Dependent Resistor (LDR) photocell of CdS. As the tracer passes through the light path, the reduction in the transmitted light intensity is followed by changes in the voltage induced by the photocell to an electric circuit. The signal is collected by an external interface and sent to a computer. Software acquires the data, does all calculations, and presents all curves and calculated variables to the monitor. The validation of the system was done by checking for data reproducibility and linearity with tracer concentration. The response of the LDR sensor with respect to the concentration of the tracer was calibrated using a set of slight dark film, obtaining a logarithmic relationship. Thus the signal enhances any disturbance, if present, particularly in the tail‐region of the curves. Measurements were taken from a Werner‐Pfleiderer ZSK 30 twin‐screw extruder equipped with K‐Tron gravimetric feeders operating with various screw speeds, feeding rates and screw configurations. In this last case, the presence of kneading elements was taken into account.
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