In-situ X-ray investigations of quench-condensed thin gold films |
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Authors: | Dirk Lü tzenkirchen-Hecht,Sascha Gertz,Christian Markert,Ronald Frahm |
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Affiliation: | Fachbereich C- Physik, Bergische Universität Wuppertal, Gauss-Straße 20, 42097 Wuppertal, Germany |
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Abstract: | Thin gold films were deposited on float glass substrates held at cryogenic temperatures down to 77 K and investigated in-situ using X-ray reflectometry and surface sensitive reflection mode X-ray absorption spectroscopy (XAFS). The combination of these in-situ X-ray methods with simultaneous electrical resistivity measurements yields information about the surface and volume microstructure of the deposited films as a function of the deposition temperature and their changes induced by a subsequent annealing treatment. The surface sensitive XAFS experiments clearly proved that the films exhibit a polycrystalline structure throughout the temperature range studied here. The data were fitted using a correlated Debye-model. The results show that for film deposition at low substrate temperatures < 130 K, a significantly decreasing Debye-temperature was found, reaching values of about 100 K in comparison to 165 K for the polycrystalline bulk material. This decrease was interpreted to be predominantly related to defective film regions with an increased static disorder. |
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Keywords: | 61.10.Ht 61.10.Kw 61.72.Hh 68.55-h |
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