Growth and Raman scattering characterization of Cu2ZnSnS4 thin films |
| |
| Authors: | P.A. Fernandes,P.M.P. Salomé |
| |
| Affiliation: | a Departamento de Física, Universidade de Aveiro, Campus Universitário de Santiago, 3810-193 Aveiro, Portugal
b Departamento de Física, Instituto Superior de Engenharia do Porto, Instituto Politécnico do Porto, Rua Dr. António Bernardino de Almeida, 431, 4200-072 Porto, Portugal |
| |
| Abstract: | In the present work we report the results of the growth, morphological and structural characterization of Cu2ZnSnS4 (CZTS) thin films prepared by sulfurization of DC magnetron sputtered Cu/Zn/Sn precursor layers. The adjustment of the thicknesses and the properties of the precursors were used to control the final composition of the films. Its properties were studied by SEM/EDS, XRD and Raman scattering. The influence of the sulfurization temperature on the morphology, composition and structure of the films has been studied. With the presented method we have been able to prepare CZTS thin films with the kesterite structure. |
| |
| Keywords: | Cu2ZnSnS4 CZTS Sputtering Sulfurization Thin film Solar cell Raman scattering |
| 本文献已被 ScienceDirect 等数据库收录！ |
|
