Microstructure of sol-gel derived TiO2 thin films characterized by atmospheric ellipsometric porosimetry |
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Authors: | Matthias Bockmeyer |
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Affiliation: | Fraunhofer-Institut für Silicatforschung, Neunerplatz 2, 97082 Würzburg, Germany |
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Abstract: | Adsorption of water vapor during ellipsometric measurements was performed in-situ for the characterization of sol-gel derived TiO2 thin films. The data obtained were compared with complementary results derived from scanning electron microscopy and photocatalytic degradation measurements. Results indicate that a less permeable surface layer encapsulates the porous interior of the films which may become more accessible by defects such as cracks. Atmospheric ellipsometric porosimetry provides a valuable tool for the microstructural characterization of sol-gel films. |
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Keywords: | Sol-gel Titania Ellipsometry Thin films Photocatalytic activity TiO2 |
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