Enhanced light absorption of Ag films deposited onto femtosecond laser microstructured silicon

Absorptive properties of silver (Ag) films with the thickness varied from 160 nm to 340 nm deposited onto the surface of femtosecond laser microstructured silicon by vacuum thermal evaporation were measured in a wavelength range of 0.3-16.7 μm. Greatly enhanced light absorption of Ag films has been observed in the whole measured wavelength range. For the same Ag film thickness (268 nm), the light absorption was strongly depended on the height and spacing of the spikes, especially in the region of 1-16.7 μm. The relation between light absorption and thickness of Ag films has also been investigated, it was shown that the light absorption decreases with the increasing thickness of Ag films. The strongly enhanced light absorption in such a wide wavelength range is mainly ascribed to the multiple reflection of light between spikes and surface plasmon excitation of noble metal nano-particles on the spikes surface.