Resistance-curve method for predicting propagation threshold of short fatigue cracks at notches |
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Authors: | K. Tanaka and Y. Akiniwa |
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Affiliation: | Department of Engineering Science, Kyoto University, Kyoto 606, Japan |
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Abstract: | A new resistance-curve method was proposed for predicting the growth threshold of short fatigue cracks near the notch root. The resistance curve was constructed in terms of the experimentally determined threshold value of the maximum stress intensity factor which was the sum of the threshold effective stress intensity range ΔKeffth and the opening stress intensity factor Kopth The ΔKeffth value was constant, irrespective of crack length or notch geometry. The relation between Kopth and crack length was independent of notch geometry. The predicted effects of the notch-root radius and the notch depth on the propagation threshold of short fatigue cracks were compared with the experimental data obtained using center-notched specimens with various notch-root radii and single-edge notched specimens with various notch depths. Excellent agreement was obtained between predictions and experiments. |
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