Minority-carrier transport parameters in degenerate n-type silicon

Direct measurements of the minority-hole transport parameters in degenerate n-type silicon were done by analyzing transient photocurrent in the frequency domain. Minority-hole mobility is found to increase with doping for dopings larger than 4×10¹⁹ cm^-3 . The ratio of minority-hole to majority-hole mobility is found to be about 2.8 at N_D=7.2×10¹⁹ cm^-3. The measured lifetime shows a strongly Auger-dependent mechanism. The extracted Auger coefficient at 296 K is C_n =2.22×10^-31 cm⁶-s^-1, and is in agreement with that reported on other works. Self-consistent checking is used to validate the accuracy of the measured results