Continuous Deposition of YBCO Films for Coated Conductor Using PLD Method |
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| Authors: | J Yang H Zhang X L Feng H Z Liu Q Zhou |
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| Affiliation: | (1) Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing, 100080, Peoples Republic of China;(2) Physics and Technology College, Hebei University, Baoding, 071002, Peoples Republic of China; |
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| Abstract: | A reel-to-reel PLD system was set up for studying YBCO coated conductor. YBCO films could be continuously grown on the CeO2/YSZ/Y2O3 buffered Ni-5W tape. Some deposition parameters were investigated. XRD θ–2θ scans were employed to characterize the c-axis orientation and in-plane texture of YBCO films deposited with different laser repetition rates and tape moving speeds.
We investigated the dependence of critical current I
c
on laser repetition rates and tape moving speeds for YBCO films. It had been found that a-axis oriented grains appeared as YBCO layer thickness increased, which prevented the values of I
c
improved. |
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