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Inside Front Cover: Defect Tolerance and Nanomechanics in Transistors that Use Semiconductor Nanomaterials and Ultrathin Dielectrics (Adv. Funct. Mater. 17/2008)
Authors:Jong‐Hyun Ahn  Zhengtao Zhu  Sang‐Il Park  Jianliang Xiao  Yonggang Huang  John A. Rogers
Affiliation:1. School of Advanced Materials Science and Engineering, SKKU Advanced Institute of Nanotechnology, Sungkyunkwan University Suwon 440‐746 (Korea);2. Departments of Materials Science and Engineering Beckman Institute and Frederick Seitz Materials Research Laboratory University of Illinois at Urbana‐Champaign Urbana, IL 61801 (USA);3. Department of Mechanical Engineering, Northwestern University Evanston, IL 60208 (USA);4. Departments of Civil and Environmental Engineering and Mechanical Engineering, Northwestern University, Evanston, IL 60208 (USA)
Abstract:
Keywords:dielectrics  flexible electronics  nanoribbons  silicon  thin‐film transistors
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