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(Zr0.7Sn0.3)TiO4陶瓷介电性能与工艺参数关系的回归分析
引用本文:王国庆,吴顺华,赵玉双,刘丹丹. (Zr0.7Sn0.3)TiO4陶瓷介电性能与工艺参数关系的回归分析[J]. 无机材料学报, 2003, 18(4): 892
作者姓名:王国庆  吴顺华  赵玉双  刘丹丹
作者单位:天津大学电子信息工程学院 天津 300072
摘    要:用回归分析方法得到了(Zr0.7Sn0.3)TiO4陶瓷的介电性能ε和δ与其工艺参数(CuO、ZnO)和玻璃的添加量(分别为x1、x2、x3 wt%)及预烧和烧结温度(分别为x4×103和x5×103℃)之间的定量关系:ε=10.9731-1.4559 x1+9.9154 x2+1.9776x3-3.3160x22-0.2286x32-200.1697x42-161.9102x52+375.1160x4x5;1g(tanδ)=-38.5876-0.6452x2+0.1235x3+31.2221x4+30.3861x5+0.1100x12+0.2077x22-0.0106x32-27.4317x4x5。能对给定工艺参数下的介电性能进行预测,并能确定满足特定介电性能的工艺参数,有助于加快电子陶瓷材料的研究。

关 键 词:回归分析  (Zr0.7Sn0.3)TiO4  介电性能  
收稿时间:2002-06-13
修稿时间:2002-07-17

Regression Analysis of the Relationship between Dielectric Properties and Processing Parameters of (Zr0.7Sn0.3)TiO4 Ceramics
WANG Guo-Qing,WU Shun-Hua,ZHAO Yu-Shuang,LIU Dan-Dan. Regression Analysis of the Relationship between Dielectric Properties and Processing Parameters of (Zr0.7Sn0.3)TiO4 Ceramics[J]. Journal of Inorganic Materials, 2003, 18(4): 892
Authors:WANG Guo-Qing  WU Shun-Hua  ZHAO Yu-Shuang  LIU Dan-Dan
Affiliation:College of Electronics and Information Engineering; Tianjin University; Tianjin 300072; China
Abstract:Regression analysis was used to obtain the quantitative relationship between the dielectric properties (ε and tanδ) and processing parameters of (Zr0.7Sn0.3)TiO4 ceramics, which include doping rates of CuO, ZnO and glass (x1, x2 and x3 wt%, respectively), the calcination and sintering (x4×103 and x5×103℃, respectively) temperatures: ε=10.9731-1.4559x1+9.9154x2+1.9776x3-3.3160x22-0.2286x23- 200.1697x24-161.9102x25+375.1160x4x5; lg(tanδ)=-38.5876-0.6452x2+0.1235x3+31.2221x4+30.3861x5+0.1100x21+0.2077x22-0.0106x23-27.4317x4x5. It is possible to predict the dielectric properties under given processing parameters, and to determine the processing parameters that satisfy certain dielectric properties. This helps to accelerate the investigation of electric ceramic materials.
Keywords:(Zr0.7Sn0.3)TiO4
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