Linearity Testing of A/D Converters Using Selective Code Measurement |
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Authors: | Shalabh Goyal Abhijit Chatterjee |
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Affiliation: | (1) Test Development-Data Converter Systems, National Semiconductor Corporation, Mail Stop D3/597, 2900 Semiconductor Drive, Santa Clara, CA 95051, USA;(2) Georgia Institute of Technology, Atlanta, GA 30332, USA |
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Abstract: | Measurement of integral non-linearity (INL) and differential non-linearity (DNL) of an A/D converter using the histogram method
incurs large test time. This test time can be a significant percentage of the total test time, especially for high resolution
and low sampling-speed A/D converters. This paper describes a test methodology for measuring the INL and DNL specifications
of A/D converters by measuring a subset of the total set of code widths. This methodology is based on the fact that manufacturing
variations in the electronic components of an A/D converter affect specific sets of codes in a similar manner. The proposed
methodology measures code width parameters across such different sets of codes and estimates the A/D converter transfer function
from the resulting information. A novel test generation methodology is presented for measuring the relevant code widths using
a piecewise linear ramp that is designed to extract test information accurately from test data in minimal test time. The test
procedure has been applied to different A/D converters and test time reduction of more than 75% has been achieved.
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Keywords: | Analog– digital conversion Manufacturing test Non-linearity Testing |
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